From e756a21636149ad47c19c659d04be93cf3071dab Mon Sep 17 00:00:00 2001 From: Donald Kjer Date: Mon, 23 Aug 2021 15:15:34 -0700 Subject: eeprom_stm32: implement high density wear leveling (#12567) * eeprom_stm32: implement wear leveling Update EECONFIG_MAGIC_NUMBER eeprom_stm32: check emulated eeprom size is large enough * eeprom_stm32: Increasing simulated EEPROM density on stm32 * Adding utility script to decode emulated eeprom * Adding unit tests * Applying qmk cformat changes * cleaned up flash mocking * Fix for stm32eeprom_parser.py checking via signature with wrong base * Fix for nk65 keyboard Co-authored-by: Ilya Zhuravlev Co-authored-by: zvecr --- tmk_core/common/test/rules.mk | 23 +++++++++++++++++++++++ 1 file changed, 23 insertions(+) create mode 100644 tmk_core/common/test/rules.mk (limited to 'tmk_core/common/test/rules.mk') diff --git a/tmk_core/common/test/rules.mk b/tmk_core/common/test/rules.mk new file mode 100644 index 0000000000..e47e5880c5 --- /dev/null +++ b/tmk_core/common/test/rules.mk @@ -0,0 +1,23 @@ +eeprom_stm32_DEFS := -DFLASH_STM32_MOCKED -DNO_PRINT -DFEE_FLASH_BASE=FlashBuf +eeprom_stm32_tiny_DEFS := $(eeprom_stm32_DEFS) \ + -DFEE_MCU_FLASH_SIZE=1 \ + -DMOCK_FLASH_SIZE=1024 \ + -DFEE_PAGE_SIZE=512 \ + -DFEE_DENSITY_PAGES=1 +eeprom_stm32_large_DEFS := $(eeprom_stm32_DEFS) \ + -DFEE_MCU_FLASH_SIZE=64 \ + -DMOCK_FLASH_SIZE=65536 \ + -DFEE_PAGE_SIZE=2048 \ + -DFEE_DENSITY_PAGES=16 + +eeprom_stm32_INC := \ + $(TMK_PATH)/common/chibios/ +eeprom_stm32_tiny_INC := $(eeprom_stm32_INC) +eeprom_stm32_large_INC := $(eeprom_stm32_INC) + +eeprom_stm32_SRC := \ + $(TMK_PATH)/common/test/eeprom_stm32_tests.cpp \ + $(TMK_PATH)/common/test/flash_stm32_mock.c \ + $(TMK_PATH)/common/chibios/eeprom_stm32.c +eeprom_stm32_tiny_SRC := $(eeprom_stm32_SRC) +eeprom_stm32_large_SRC := $(eeprom_stm32_SRC) -- cgit v1.2.3